Used semiconductor & Scientific equipment, ISO14001 certified

Japanese

Tanaka Corporation

ESPEC／Highly accelerated stress test systems／EHS-221MD Ref No.02898
  • System : Single vessel type
  • Control method : Unsaturated control, Wet saturated control, Wet and dry bulb temperature control
  • Unsaturated method : 1)Temperature range: +105.0 to +142.9 deg C  2)Humidity control range: 75 to 100 percent PH  3)Pressure range: 0.020 to 0.196MPa
  • Wet saturated control : 1)Temperature range: +105.0 to +132.9 deg C  2)Pressure range: 0.020 to 0.196MPa
  • Wet and dry bulb temperature method : 1)Temperature range: +105.6 to +142.9 deg C  2)Humidity control range :75 to 95 percent PH  3)Pressure range: 0.020 to 0.196MPa
  • Inner dimensions of test area : dia 450 X L554mm
  • Inner capacity of test area : 46L X 2
  • Exterior Dimensions : W860 X H1795 X D1000mm
  • Weight : 390kg
  • Power supply : 200V  dia 1  50/60Hz  Max.40A
  • 2007 vintage
  • Accessories : Paperless recorder(FX 100), Communication function(RS232C), Plug for specimen power supply control terminal, Shelves(large X 1, small X 1)10L polyethylene tank
  • Manual : Yes
ESPEC／Highly accelerated stress test systems／EHS-221MD Ref No.02898  ESPEC／Highly accelerated stress test systems／EHS-221MD Ref No.02898  ESPEC／Highly accelerated stress test systems／EHS-221MD Ref No.02898  
ESPEC／Highly accelerated stress test systems／EHS-221MD Ref No.02898