Used semiconductor & Scientific equipment, ISO14001 certified

Japanese

Tanaka Corporation

DAGE／Multipurpose Bondtester／Series 4000 Ref.No.02979
  • 2004 vintage
  • 1) Model: Series 4000
  • 2) PC for controll(OS: Windows XP)
  • 3) Attached sensor : BS250: Ball Shear Load Cell(0-250g range) DS100: Die Shear Load Cell(0-100kg range), TP100: Tweezer Peel Test Load Cell(0-100g range)
  • 4)Temperature Control Unit for Bump Pull Load Cell
  • 5)Key bat
  • 6) Joystick
  • 7) Armrest

DAGE／Multiporpose Bondtester／Series 4000 Ref.No.02979   DAGE／Multiporpose Bondtester／Series 4000 Ref.No.02979   DAGE／Multiporpose Bondtester／Series 4000 Ref.No.02979  
 DAGE／Multiporpose Bondtester／Series 4000 Ref.No.02979  DAGE／Multiporpose Bondtester／Series 4000 Ref.No.02979  DAGE／Multiporpose Bondtester／Series 4000 Ref.No.02979